T-NT Lognormal

The pdf for the temperature non-thermal relationship and the lognormal distribution is given next.

The pdf of the lognormal distribution is given by:

where:

The median of the lognormal distribution is given by:

(9)

The T-NT lognormal model pdf can be obtained first by setting = L(V) in Eqn. (1). Therefore:

or:

Thus:

(10)

Substituting Eqn. (10) into Eqn. (8) yields the T-NT lognormal model pdf or:

T-NT Lognormal Statistical Properties Summary

The Mean

(11)

The Standard Deviation

(12)

The Mode

T-NT Lognormal Reliability

For the T-NT lognormal model, the reliability for a mission of time T, starting at age 0, for the T-NT lognormal model is determined by:

or:

Reliable Life

For the T-NT lognormal model, the reliable life, or the mission duration for a desired reliability goal, tR is estimated by first solving the reliability equation with respect to time, as follows:

where:

and:

Since = ln(T) the reliable life, tR, is given by:

Lognormal Failure Rate

The T-NT lognormal failure rate is given by:

Parameter Estimation

Maximum Likelihood Estimation Method

The complete T-NT lognormal log-likelihood function is:

where:

and:

The solution (parameter estimates) will be found by solving , , , so that = 0, = 0, = 0 and = 0.

Example

Twelve electronic devices were put into a continuous accelerated test and the following data were collected.

Using ALTA and the T-NT lognormal model, the following parameters were obtained:

= 0.1825579885,
= 3729.6503028119,
= 0.0352919977,
= 0.7767966480.

A probability plot for the use stress levels of 323K and 2V is shown next.

An acceleration factor plot, in which one of the stresses must be kept constant, can also be obtained. For example, in the following plot, the acceleration factor is plotted versus temperature given a constant voltage of 2V.

See Also:
Temperature-NonThermal Relationship


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