Reliability Publications Index for ReliaSoft's Reliability Edge and HotWire

Subject Index
for ReliaSoft's Reliability Publications

This page presents a subject index for ReliaSoft's reliability publications, the quarterly newsletter Reliability Edge and the monthly eMagazine Reliability HotWire.

Numerics A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Numerics

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8D
- Team-based Problem Solving Methods and XFRACAS [Reliability Edge V7I1]

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Ability to Edit Item Properties in Separate Worksheets [HotWire Issue 33 (November 2003)]
Accelerated Degradation Analysis
- Using Degradation Data for Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
Accelerated Life Testing...Why? [HotWire Issue 18 (August 2002)]
Accelerated Life Test Plans [Reliability Edge V8I1]
Accelerated Test Planning [Reliability Edge V8V1]
- Accelerated Life Test Plans [Reliability Edge V8I1]
- Optimal Allocations of Stress Levels and Test Units in Accelerated Tests [Reliability Edge V5I1]

Accelerated Testing Life Data Analysis
- A Simple Demonstration of Accelerated Life Testing Analysis [Reliability Edge V2I1 (1Q 2001)]
- Accelerated Life Testing...Why? [HotWire Issue 18 (August 2002)]
- An Accelerated Life Testing Model Involving Performance Degradation [HotWire Issue 38 (April 2004)]
- Analysis of Accelerated Life Tests with Competing Failure Modes [HotWire Issue 67 (September 2006)]
- Analyzing Accelerated Test Data with Time-Varying Test and Use Stress Profiles [Reliability Edge V2I3 (4Q 2001)]
- Analyzing Accelerated Test Data with Unrelated Failures [HotWire Issue 30 (August 2003)]
- Analyzing Step Stress Data [HotWire Issue 4 (June 2001)]
- Basic Concepts of Accelerated Life Testing Analysis [HotWire Issue 43 (September 2004)]
- Degradation Analysis in Step-Stress Accelerated Testing [HotWire Issue 65 (July 2006)]
- Determining the Reliability of a System with Load Sharing [HotWire Issue 20 (October 2002)]
- Expanded Models for Accelerated Life Test Analysis with Time-Varying Stresses [HotWire Issue 75 (May 2007)]
- General Log-Linear Model for Accelerated Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
- Introduction to Accelerated Testing Types [Reliability Edge V2I3 (4Q 2001)]
- Introduction to the Generalized Eyring Life-Stress Relationship [HotWire Issue 74 (April 2007)]
- Let the Data Speak About Activation Energy [HotWire Issue 17 (July 2002)]
- Looking at Thermal Cycling Data in Quantitative Accelerated Life Testing [HotWire Issue 19 (September 2002)]
- Modeling Interactions Between Variables in Accelerated Life Testing or Life-Stress Analysis [HotWire Issue 53 (July 2005)]
- Reliability Testing [HotWire Issue 41 (July 2004)]
- Using Accelerated Life Testing Analysis to Characterize "Shelf Life" [HotWire Issue 34 (December 2003)]
- Using Categorical Variables in Accelerated Life Testing and Life-Stress Analysis [HotWire Issue 53 (July 2005)]
- Using Quantitative Accelerated Life Testing Models for Other Applications [Reliability Edge V3I1 (1Q 2002)]
- Utilizing Residual Plots in Accelerated Life Testing Data Analysis [HotWire Issue 51 (May 2005)]
- Verifying the Assumption of a Constant Shape Parameter in Accelerated Life Testing Data [HotWire Issue 16 (June 2002)]

Acceleration Factor

Let the Data Speak About Activation Energy [HotWire Issue 17 (July 2002)]

Accounting for Seasonal Effects in Warranty Analysis [Reliability Edge V8I2 (2Q 2007)]

Activation Energy

Let the Data Speak About Activation Energy [HotWire Issue 17 (July 2002)]

Aircraft Systems and Powerplant Analysis

Creating Initial Scheduled Maintenance Plans: Using the MSG-3 Aircraft Systems and Powerplant Analysis Process to Develop an Initial Scheduled Maintenance Plan [Reliability Edge V3I1 (1Q 2002)]

Allowable Failures
- Design of Reliability Tests [HotWire Issue 24 (February 2003)]
ALTA Software
- A Simple Demonstration of Accelerated Life Testing Analysis [Reliability Edge V2I1 (1Q 2001)]
- Accelerated Life Test Plans [Reliability Edge V8I1]
- Analyzing Accelerated Test Data with Time-Varying Test and Use Stress Profiles [Reliability Edge V2I3 (4Q 2001)]
- Analyzing Accelerated Test Data with Unrelated Failures [HotWire Issue 30 (August 2003)]
- Analyzing Step-Stress Data [HotWire Issue 4 (June 2001)]
- Applying Reliability DOE Techniques to Investigate Effects on Product Life [Reliability Edge V9I1 (2Q 2008)]
- Basic Concepts of Accelerated Life Testing Analysis [HotWire Issue 43 (September 2004)]
- Can the Likelihood Value be Greater Than 0? [HotWire Issue 92 (October 2008)]
- Common Shape Parameter Likelihood Ratio Test [HotWire Issue 45 (November 2004)]
- Degradation Analysis in Destructive Testing [HotWire Issue 85 (March 2008)]
- Degradation Analysis in Destructive Testing - Part II [HotWire Issue 86 (April 2008)
- Degradation Analysis in Step-Stress Accelerated Testing [HotWire Issue 65 (July 2006)]
- Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]
- Estimating Reliability Based on Multiple Random Stress Types [HotWire Issue 82 (December 2007)]
- Expanded Models for Accelerated Life Test Analysis with Time-Varying Stresses [HotWire Issue 75 (May 2007)]
- Field Data [HotWire Issue 42 (August 2004)]
- General Log-Linear Model for Accelerated Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
- How to Define a Complicated Stress Profile [HotWire Issue 87 (May 2008)]
- Introducing ReliaSoft's ALTA 6 and ALTA 6 PRO [Reliability Edge V2I2 (2Q 2001)]
- Introduction to Accelerated Testing Types [Reliability Edge V2I3 (4Q 2001)]
- Introduction to the Generalized Eyring Life-Stress Relationship [HotWire Issue 74 (April 2007)]
- Introduction to the Temperature-Humidity Model [HotWire Issue 50 (April 2005)]
- Let the Data Speak About Activation Energy [HotWire Issue 17 (July 2002)]
- Life Data Analysis of Load Sharing Units [HotWire Issue 81 (November 2007)]
- Look Under the Hood at the Cumulative Damage Model, A [HotWire Issue 23 (January 2003)]
- Modeling Interactions Between Variables in Accelerated Life Testing or Life-Stress Analysis [HotWire Issue 53 (July 2005)]
- Optimal Allocations of Stress Levels and Test Units in Accelerated Tests [Reliability Edge V5I1]
- Predicting Warranty Returns Based on Customer Usage Data [Reliability Edge V3I1 (1Q 2002)]
- Reliability Prediction Methods for Electronic Products [Reliability Edge V9I1 (2Q 2008)]
- ReliaSoft Corporation: Ten Year Retrospective [Reliability Edge V3I3 (4Q 2002)]
- Using Accelerated Life Testing Analysis to Characterize "Shelf Life" [HotWire Issue 34 (December 2003)]
- Using ALTA with Multi-Stress Physics of Failure Models [HotWire Issue 90 (August 2008)]
- Using Categorical Variables in Accelerated Life Testing and Life-Stress Analysis [HotWire Issue 53 (July 2005)]
- Using QALT Models to Analyze System Configurations with Load Sharing [Reliability Edge V3I3 (4Q 2002)]
- Using Quantitative Accelerated Life Testing Models for Other Applications [Reliability Edge V3I1 (1Q 2002)]
- Using Reliability Block Diagrams to Analyze Dependent and Independent Failure Modes [HotWire Issue 27 (May 2003)]
- Utilizing Residual Plots in Accelerated Life Testing Data Analysis [HotWire Issue 51 (May 2005)]

An Accelerated Life Testing Model Involving Performance Degradation [HotWire Issue 38 (April 2004)]

Analysis of Non-Homogeneous Warranty Data [HotWire Issue 59 (January 2006)]

Analysis Settings

Analyzing Step-Stress Data [HotWire Issue 4 (June 2001)]
Which Analysis Settings Should I Use? [HotWire Issue 1 (March 2001)]

Analyzing Accelerated Test Data with Time-Varying Test and Use Stress Profiles [Reliability Edge V2I3 (4Q 2001)]

Analyzing Accelerated Test Data with Unrelated Failures [HotWire Issue 30 (August 2003)]
Analyzing Excess System Downtime Through System Modeling [HotWire Issue 80 (October 2007)]

Analyzing Growth Success/Failure and Reliability Data Using the Lloyd Lipow Model [HotWire Issue 83 (January 2008)]

Analyzing Step-Stress Data [HotWire Issue 4 (June 2001)]

Analyzing Success/Failure Data Using the Crow Discrete Reliability Growth Model [HotWire Issue 81 (November 2007)]

Analyzing Success/Failure and Reliability Data Using the Logistic Model [HotWire Issue 82 (December 2007)]

Analyzing Sudden Death Testing Data [HotWire Issue 5 (July 2001)]

Analyzing the Effect of Inspection Intervals on Availability [Reliability Edge, V4I2]

Analyzing Warranty Data of Repairable Systems [HotWire Issue 64 (June 2006)]

ANOVA

An Example of Using Reliability DOE for Life Testing [HotWire Issue 88 (June 2008)]
Applying Reliability DOE Techniques to Investigate Effects on Product Life [Reliability Edge V9I1 (2Q 2008)]
Using DOE++ to Analyze Unbalanced Designs [HotWire Issue 94 (December 2008)]

Applications of Non-Parametric Recurrence Data Analysis in Reliability Engineering [HotWire Issue 57 (November 2005)]
Applications of the Weibull-Bayesian Distribution in Life Data Analysis [HotWire Issue 55 (September 2005)]
Applying Reliability DOE Techniques to Investigate Effects on Product Life [Reliability Edge V9I1 (2Q 2008)]

Automated Systems

Benefits of Automated Reliability Systems [Reliability Edge V3I1 (1Q 2002)]
Implementing an Automated Reliability/Quality System: What You Can Expect [Reliability Edge V3I1 (1Q 2002)]

Availability and the Different Ways to Calculate It [HotWire Issue 79 (September 2007)]

Availability Estimation

Analyzing the Effect of Inspection Intervals on Availability [Reliability Edge, V4I2]
Availability and the Different Ways to Calculate It [HotWire Issue 79 (September 2007)
Critical Examination of a Common Assumption in System Availability Computations [Reliability Edge V3I2 (3Q 2002)]
Estimating Availability Through Simulation [HotWire Issue 8 (October 2001)]
Relationship Between Availability and Reliability [HotWire Issue 2 6 (April 2003)]
Reliability and Maintainability Analysis for a Remote Telecommunications System [Reliability Edge V4I1]

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Backlog
- Throughput Analysis (Part I) [HotWire Issue 27 (May 2003)]
- Throughput Analysis (Part II) [HotWire Issue 28 (June 2003)]
Balanced/Unbalanced Designs
- Using DOE++ to Analyze Unbalanced Designs [HotWire Issue 94 (December 2008)]
Basic Concepts of Accelerated Life Testing Analysis [HotWire Issue 43 (September 2004)]
Basic Concepts of FMEA and FMECA [HotWire Issue 46 (December 2004)]
Basic Steps of Applying Reliability Centered Maintenance (RCM) – Part I [HotWire Issue 72 (February 2007)]
Basic Steps of Applying Reliability Centered Maintenance (RCM) – Part II [HotWire Issue 73 (March 2007)]
Basic Steps of Applying Reliability Centered Maintenance (RCM) – Part III [HotWire Issue 76 (June 2007)]
Bathtub Curve and Product Failure Behavior Part 1, The [HotWire Issue 21 (November 2002)]
Bathtub Curve and Product Failure Behavior Part 2, The [HotWire Issue 22 (December 2002)]
Bayesian Confidence Bounds [HotWire Issue 60 (February 2006)]
Bayesian Statistics
- Applications of the Weibull-Bayesian Distribution in Life Data Analysis [HotWire Issue 55 (September 2005)]
- Bayesian Confidence Bounds [HotWire Issue 60 (February 2006)]
- Introduction to the Weibull-Bayesian Distribution [HotWire Issue 55 (September 2005)]
- A New Era in Life Data Analysis... Weibull++ 7 [Reliability Edge V6I2]
- You Have a Small Data Set: What Do You Do? [HotWire Issue 72 (February 2007)]
Benefits of Automated Reliability Systems [Reliability Edge V3I1 (1Q 2002)]
Beta
- A High Value of Beta is Not Necessarily Cause For Concern [Reliability Edge V2I1 (1Q 2001)]
- Verifying the Assumption of a Constant Shape Parameter in Accelerated Life Testing Data [HotWire Issue 16 (June 2002)]
Beta Binomial Confidence Bounds on the Mixed Weibull Distribution [HotWire Issue 48 (February 2005)]
Biased Parameters
- Understanding Biasedness [HotWire Issue 25 (March 2003)]
BlockSim Software
- Ability to Edit Item Properties in Separate Worksheets [HotWire Issue 33 (November 2003)]
- Analysis and Modeling of Grouped and Opportunistic Preventive Maintenance [HotWire Issue 78 (August 2007)]
- Analyzing Excess System Downtime Through System Modeling [HotWire Issue 80 (October 2007)]
- Analyzing the Effect of Inspection Intervals on Availability [Reliability Edge, V4I2]
- Availability and the Different Ways to Calculate It [HotWire Issue 79 (September 2007)
- Avoiding a Common Mistake in the Analysis of Repairable Systems[Reliability Edge V7I1]
- Case Study Report: Failure Reporting, Evaluation and Display (FRED) Report [Reliability Edge V3I2 (3Q 2002)]
- Comparison of RBD and Fault Tree Simulation [HotWire Issue 44 (October 2004)]
- Component Reliability Importance in System Reliability Analysis [HotWire Issue 62 (April 2006)]
- Determining the Reliability of a System with Load Sharing [HotWire Issue 20 (October 2002)]
- Determining Reliability for Complex Systems Part 1 [HotWire Issue 2 (April 2001)]
- Determining Reliability for Complex Systems Part 2 [HotWire Issue 3 (May 2001)]
- Don’t Let Your Event/Maintenance Log Data Go to Waste [HotWire Issue 68 (October 2006)]
- Effect of Inspection Intervals, The [HotWire Issue 28 (June 2003)]
- Estimating Availability Through Simulation [HotWire Issue 8 (October 2001)]
- Estimating the Expected Number of Failures for Items with Minimal or Perfect Repair [HotWire Issue 90 (August 2008)]
- Expanded Algebraic Solutions for RBDs and FTDs [HotWire Issue 33 (November 2003)]
- Fault Tree Analysis, Reliability Block Diagrams and BlockSim FTI Edition [Reliability Edge V4I1]
- How Long Should You Burn In a System? [HotWire Issue 69 (Novmeber 2006)]
- How to Simplify Complex RBDs with a Commonly Used Distribution [HotWire Issue 68 (October 2006)]
- Imperfect Repair [HotWire Issue 24 (February 2003)]
- Introduction to Case Study Report: Integrating Weibull Analysis into Bodyshop Reliability Engineering [Reliability Edge V3I2 (3Q 2002)]
- Life Cycle Cost Analysis [HotWire Issue 47 (January 2005)]
- Life Data Analysis of Load Sharing Units [HotWire Issue 81 (November 2007)]
- Maintenance Policies in BlockSim [Hotwire Issue 89 (July 2008)]
- Minimal Cut Sets [HotWire Issue 63 (May 2006)]
- A Model to Estimate Restoration Factors [Reliability Edge V6I1]
- Modeling a Complex Maintenance Scenario in BlockSim [HotWire Issue 89 (July 2008)]
- Modeling Periodical Inspection and Early Failure Detection in BlockSim [HotWire Issue 62 (April 2006)]
- MTTF, MTBF, Mean Time Between Replacements and MTBF with Scheduled Replacements [HotWire Issue 94 (December 2008)]
- On-Condition Maintenance Using P-F Interval or Failure Detection Threshold (FDT) [HotWire Issue 76 (June 2007)]
- Optimum Preventive Maintenance Replacement Time for a Single Component [Reliability Edge V1I1 (2Q 2000)]
- Overview of BlockSim 6 Containers in Simulation [HotWire Issue 31 (September 2003)]
- Overview of Fault Tree Gates (Part I) [HotWire Issue 37 (March 2004)]
- Overview of Fault Tree Gates (Part II) [HotWire Issue 38 (April 2004)]
- Quantitative Approach to Setting Component Reliability Specifications [Reliability Edge V2I2 (2Q 2001)]
- Relationship Between Availability and Reliability [HotWire Issue 2 6 (April 2003)]
- Reliability and Maintainability Analysis for a Remote Telecommunications System [Reliability Edge V4I1]
- Reliability Growth Analysis and Plots [Reliability Edge V4I1]
- Reliability Importance Measures of Components in a Complex System - Identifying the 20% in the 80/20 Rule [HotWire Issue 66 (August 2006)]
- Reliability of Standby Systems with a Switching Device [HotWire Issue 22 (December 2002)]
- Reliability Phase Diagram Analysis [Reliability Edge V8I1]
- ReliaSoft Corporation: Ten Year Retrospective [Reliability Edge V3I3 (4Q 2002)]
- Restoration Factors in BlockSim [HotWire Issue 77 (July 2007)]
- Throughput Analysis (Part I) [HotWire Issue 27 (May 2003)]
- Throughput Analysis (Part II) [HotWire Issue 28 (June 2003)]
- Time Varying and Multi-Phase Throughput Analysis [HotWire Issue 79 (September 2007)]
- Treating Common Cause Failures in Fault Trees [HotWire Issue 54 (August 2005)]
- Updating the Classic Reliability Block Diagram Methodology and Constructs [Reliability Edge V3I2 (3Q 2002)]
- Using BlockSim 6 for Planning Just-In-Time Ordering of Spare Parts [HotWire Issue 70 (December 2006)]
- Using BlockSim for System Capability Analysis [HotWire Issue 91 (September 2008)]
- Using BlockSim to Analyze Systems that Do Not Operate 24 Hours per Day [HotWire Issue 48 (February 2005)]
- Using Duty Cycles in System Reliability Analysis [HotWire Issue 74 (April 2007)]
- Using Maintenance Policies [HotWire Issue 31 (September 2003)]
- Using Off-Site Spare Part Stocks to Maintain Systems [HotWire Issue 75 (May 2007)]
- Using Pools and Crews in System Analysis (Part I) [HotWire Issue 29 (July 2003)]
- Using Pools and Crews in System Analysis (Part II) [HotWire Issue 30 (August 2003)]
- Using QALT Models to Analyze System Configurations with Load Sharing [Reliability Edge V3I3 (4Q 2002)]
- Using Reliability Block Diagrams to Analyze Dependent and Independent Failure Modes [HotWire Issue 27 (May 2003)]
- Using Reliability Importance Measures to Guide Component Improvement Efforts [Reliability Edge V1I1 (2Q 2000)]
- Using the Fault Tree Method for Dependent and Independent Failure Modes [HotWire Issue 29 (July 2003)]
- Using Weibull++ and BlockSim to Calculate t₀ [HotWire Issue 46 (December 2004)]
Bounds (see Confidence Bounds)
Bringing It All Together [HotWire Issue 45 (November 2004)]
Burn-In
- How Long Should You Burn In a System? [HotWire Issue 69 (November 2006)]
- Sources of Reliability Data: Reliability Testing Basics [HotWire Issue 5 (July 2001)]
- Bathtub Curve and Product Failure Behavior Part 1, The [HotWire Issue 21 (November 2002)]
- Guidelines for Burn-in Justification and Burn-in Time Determination [Reliability Edge V7I2]
- Quantifying Optimum Burn-in Period [HotWire Issue 58 (December 2005)]
- Reliability Testing [HotWire Issue 41 (July 2004)]

[Top]

Can the Likelihood Value be Greater Than 0? [HotWire Issue 92 (October 2008)]
Case Study Report: Failure Reporting, Evaluation and Display (FRED) Report [Reliability Edge V3I2 (3Q 2002)]
Categorical Variables
- Using Categorical Variables in Accelerated Life Testing and Life-Stress Analysis [HotWire Issue 53 (July 2005)]
Censored Data
- An Example of Using Reliability DOE for Life Testing [HotWire Issue 88 (June 2008)]
- Life Data Classifications [Reliability Edge V1I1 (2Q 2000)]
Certified Reliability Professional Program [Reliability Edge V8I1]
Change Tracking
- Using the New Change Log Utility in Xfmea or RCM++ [HotWire Issue 69 (November 2006)]
Characteristics of the Lognormal Distribution [HotWire Issue 47 (January 2005)]
Characteristics of the Weibull Distribution [HotWire Issue 14 (April 2002)]
Characterizing Your Product's Reliability [HotWire Issue 1 (March 2001)]
Characterizing Your Product's Reliability [HotWire Issue 32 (October 2003)]
Chi-Squared Test
- How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]
Choosing an Appropriate Distribution to Analyze Process Variations [Reliability Edge, V4I2]
Classic Case Studies in Reliability Analysis: The Weibull Distribution [Reliability Edge V2I2 (2Q 2001)]
Common Shape Parameter Likelihood Ratio Test [HotWire Issue 45 (November 2004)]
Comparing Two Data Sets [HotWire Issue 23 (January 2003)]
Comparison of MLE and Rank Regression When the Data Set Contains Suspensions [HotWire Issue 16 (June 2002)]
Comparison of RBD and Fault Tree Simulation [HotWire Issue 44 (October 2004)]
Competing Failure Modes Analysis [Reliability Edge V2I3 (4Q 2001)]
Common Beta Hypothesis Test In Reliability Growth and Repairable Systems Analysis [HotWire Issue 61 (March 2006)]
Common Cause Failures
- Treating Common Cause Failures in Fault Trees [HotWire Issue 54 (August 2005)]
Comparing Maintenance Strategies Based on Cost and Availability [Reliability Edge V6I2]
Competing Failure Modes Analysis
- Analysis of Accelerated Life Tests with Competing Failure Modes [HotWire Issue 67 (September 2006)]
- Multimodal Analysis [HotWire Issue 12 (February 2002)]
- A New Era in Life Data Analysis... Weibull++ 7 [Reliability Edge V6I2]
Complete Data
- Life Data Classifications [Reliability Edge V1I1 (2Q 2000)]
Complex Configuration
- Updating the Classic Reliability Block Diagram Methodology and Constructs [Reliability Edge V3I2 (3Q 2002)]
Complex Systems
- Determining Reliability for Complex Systems Part 1 [HotWire Issue 2 (April 2001)]
- Determining Reliability for Complex Systems Part 2 [HotWire Issue 3 (May 2001)]
- Expanded Algebraic Solutions for RBDs and FTDs [HotWire Issue 33 (November 2003)]
- Using Reliability Importance Measures to Guide Component Improvement Efforts [Reliability Edge V1I1 (2Q 2000)]
Component Reliability Importance in System Reliability Analysis [HotWire Issue 62 (April 2006)]
Component Throughput
- Throughput Analysis (Part I) [HotWire Issue 27 (May 2003)]
- Throughput Analysis (Part II) [HotWire Issue 28 (June 2003)]
Conditional Reliability
- Financial Applications for Weibull Analysis [HotWire Issue 14 (April 2002)]
- Financial Applications for Weibull Analysis [HotWire Issue 35 (January 2004)]
Confidence Bounds
- Bayesian Confidence Bounds [HotWire Issue 60 (February 2006)]
- Beta Binomial Confidence Bounds on the Mixed Weibull Distribution [HotWire Issue 48 (February 2005)]
- Contour Plots and Confidence Bounds on Parameters [HotWire Issue 18 (August 2002)]
- Contour Plots and Confidence Bounds on Parameters (Part II) [HotWire Issue 19 (September 2002)]
- Differences Between Type I (Time) and Type II (Reliability) Confidence Bounds [HotWire Issue 17 (July 2002)]
- Likelihood Ration Confidence Bounds [HotWire Issue 42 (August 2004)]
- What Are Confidence Bounds? [HotWire Issue 4 (June 2001)]
- What Are Confidence Bounds? [HotWire Issue 34 (December 2003)]
- Which Analysis Settings Should I Use? [HotWire Issue 1 (March 2001)]
Contour Plots
- Comparing Two Data Sets [HotWire Issue 23 (January 2003)]
- Contour Plots and Confidence Bounds on Parameters [HotWire Issue 18 (August 2002)]
- Contour Plots and Confidence Bounds on Parameters (Part II) [HotWire Issue 19 (September 2002)]
- Verifying the Assumption of a Constant Shape Parameter in Accelerated Life Testing Data [HotWire Issue 16 (June 2002)]
Contour Plots and Confidence Bounds on Parameters [HotWire Issue 18 (August 2002)]
Contour Plots and Confidence Bounds on Parameters (Part II) [HotWire Issue 19 (September 2002)]
Corrective Maintenance
- Maintenance Policies in BlockSim [Hotwire Issue 89 (July 2008)]
- Modeling a Complex Maintenance Scenario in BlockSim [HotWire Issue 89 (July 2008)]
Correlation Coefficient
- How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]
- Rank Regression Parameter Estimation [HotWire Issue 10 (December 2001)]
Cost of Replacements
- Optimum Preventive Maintenance Replacement Time for a Single Component [Reliability Edge V1I1 (2Q 2000)]
Creating Initial Scheduled Maintenance Plans: Using the MSG-3 Aircraft Systems and Powerplant Analysis Process to Develop an Initial Scheduled Maintenance Plan [Reliability Edge V3I1 (1Q 2002)]
Critical Examination of a Common Assumption in System Availability Computations [Reliability Edge V3I2 (3Q 2002)]
Criticality Analysis
- Criticality Analysis [Reliability Edge V4I1]
- Failure Modes, Effects and Criticality Analysis [Reliability Edge V3I2 (3Q 2002)]
Crow-AMSAA Reliability Growth Model
- Analyzing Success/Failure Data Using the Crow Discrete Reliability Growth Model [HotWire Issue 81 (November 2007)]
- Analyzing Warranty Data of Repairable Systems [HotWire Issue 64 (June 2006)]
- Introduction to the Crow-AMSAA Reliability Growth Model [HotWire Issue 49 (March 2005)]
Cumulative Binomial for Test Design and Analysis [Reliability Edge V2I2 (2Q 2001)]
Cumulative Damage Model
- Analyzing Step-Stress Data [HotWire Issue 4 (June 2001)]
- Expanded Models for Accelerated Life Test Analysis with Time-Varying Stresses [HotWire Issue 75 (May 2007)]
- Look Under the Hood at the Cumulative Damage Model, A [HotWire Issue 23 (January 2003)]
Cumulative Density Function (cdf)
- Maximum Likelihood Estimation [HotWire Issue 9 (November 2001)]
- Maximum Likelihood Function [HotWire Issue 33 (November 2003)]
- The Reliability Function [HotWire Issue 7 (September 2001)]
Customer Usage Data
- Customer Usage Profiling [HotWire Issue 11 (January 2002)]
- Predicting Warranty Returns Based on Customer Usage Data [Reliability Edge V3I1 (1Q 2002)]
- Reliability Testing [HotWire Issue 41 (July 2004)]
- Sources of Reliability Data: Reliability Testing Basics [HotWire Issue 5 (July 2001)]
Cut Sets
- Minimal Cut Sets [HotWire Issue 63 (May 2006)]

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Dashboard

Benefits of Automated Reliability Systems [Reliability Edge V3I1 (1Q 2002)]
Data Collection [HotWire Issue 43 (September 2004)]
Implementing an Automated Reliability/Quality System: What You Can Expect [Reliability Edge V3I1 (1Q 2002)]

Data Analysis and Reporting [HotWire Issue 44 (October 2004)]

Data Collection [HotWire Issue 43 (September 2004)]

Data Types (Classifications)

Life Data Classifications [Reliability Edge V1I1 (2Q 2000)]

Data, Where Art Thou? [Reliability Edge V2I3 (4Q 2001)]

DCOV
- Team-based Problem Solving Methods and XFRACAS [Reliability Edge V7I1]

Decomposition Method

Determining Reliability for Complex Systems [HotWire Issue 2 (April 2001)]

Defining Distributions-Part 1: The Probability Distribution Function [HotWire Issue 12 (February 2002)]

Degradation Analysis

An Accelerated Life Testing Model Involving Performance Degradation [HotWire Issue 38 (April 2004)]
Degradation Analysis in Destructive Testing [HotWire Issue 85 (March 2008)]
Degradation Analysis in Destructive Testing - Part II [HotWire Issue 86 (April 2008)
Degradation Analysis in Step-Stress Accelerated Testing [HotWire Issue 65 (July 2006)]
Modeling Periodical Inspection and Early Failure Detection in BlockSim [HotWire Issue 62 (April 2006)]
Using Degradation Data for Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
Using Quantitative Accelerated Life Testing Models for Other Applications [Reliability Edge V3I1 (1Q 2002)]

Degradation Analysis in Destructive Testing [HotWire Issue 85 (March 2008)]

Degradation Analysis in Destructive Testing - Part II [HotWire Issue 86 (April 2008)]

Degradation Analysis in Step-Stress Accelerated Testing [HotWire Issue 65 (July 2006)]

Deming, W. Edwards

What Would Deming Do? [HotWire Issue 67 (September 2006)]

Derating for Electronic Components [HotWire Issue 92 (October 2008)]

Design for Reliability (DFR)

Interaction Between the House of Quality (within Design for Six Sigma) and the FMEA (within Design for Reliability) [HotWire Issue 93 (November 2008)]

Design of Experiments

Applying Reliability DOE Techniques to Investigate Effects on Product Life [Reliability Edge V9I1 (2Q 2008)]
Discussion of the Residual Sum of Squares in DOE [HotWire Issue 86 (April 2008)]
Introduction to Design of Experiments (DOE) [HotWire Issue 84 (February 2008)]
Introduction to Design of Experiments (DOE) - DOE Types [HotWire Issue 85 (March 2008)]
Residual Plots for Lifetime Distributions [HotWire Issue 87 (May 2008)]

Design of Reliability Tests
- Design for Reliability: Overview of the Process and Applicable Techniques [Reliability Edge V8I2 (2Q 2007)]
- Design of Reliability Tests [HotWire Issue 24 (February 2003)]
- Type I and Type II Errors and Their Applications [HotWire Issue 88 (June 2008)]
- Using OC Curves in Design of Reliability Tests [HotWire Issue 93 (November 2008)]
- Using Simulation to Design Reliability Demonstration Tests [HotWire Issue 60 (February 2006)]
Destructive Testing
- Degradation Analysis in Destructive Testing [HotWire Issue 85 (March 2008)]
- Degradation Analysis in Destructive Testing - Part II [HotWire Issue 86 (April 2008)

Determining Reliability for Complex Systems [HotWire Issue 2 (April 2001)]

Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]

Determining the Reliability of a System with Load Sharing [HotWire Issue 20 (October 2002)]

Determining the Reliability of a System with Standby Redundancy [HotWire Issue 21 (November 2002)]

Developing a Reliability Benchmark Survey [Reliability Edge V3I3 (4Q 2002)]

Developing Good Reliability Specifications [HotWire Issue 3 (May 2001)]

Developmental Testing with Corrective Actions Implemented During the Test and Delayed Fixes [HotWire Issue 36 (February 2004)]

Difference Between Physical and Reliability-Wise Arrangement [HotWire Issue 20 (October 2002)]

Differences Between Type I (Time) and Type II (Reliability) Confidence Bounds [HotWire Issue 17 (July 2002)]

Direct Measurement Program

Customer Usage Profiling [HotWire Issue 11 (January 2002)]

Discussion of the Residual Sum of Squares in DOE [HotWire Issue 86 (April 2008)]

The Distribution Wizard in Weibull++ 7 [HotWire Issue 91 (September 2008)]

Distributions

Beta Binomial Confidence Bounds on the Mixed Weibull Distribution [HotWire Issue 48 (February 2005)]
Characteristics of the Lognormal Distribution [HotWire Issue 47 (January 2005)]
Characteristics of the Weibull Distribution [HotWire Issue 14 (April 2002)]
Choosing an Appropriate Distribution to Analyze Process Variations [Reliability Edge, V4I2]
Cumulative Binomial for Test Design and Analysis [Reliability Edge V2I2 (2Q 2001)]
Defining Distributions-Part 1: The Probability Distribution Function [HotWire Issue 12 (Febraury 2002)]
The Generalized Gamma Distribution and Reliability Analysis [HotWire Issue 15 (May 2002)]
Introduction to the Weibull-Bayesian Distribution [HotWire Issue 55 (September 2005)]
Limitations of the Exponential Distribution for Reliability Analysis [Reliability Edge V2I3 (4Q 2001)]
Location Parameter of the Weibull Distribution [HotWire Issue 15 (May 2002)]
Overview of the Gumbel, Logistic, Loglogistic and Gamma Distributions [HotWire Issue 56 (October 2005)]
Residual Plots for Lifetime Distributions [HotWire Issue 87 (May 2008)]

Don’t Let Your Event/Maintenance Log Data Go to Waste [HotWire Issue 68 (October 2006)]

DMAIC

Team-based Problem Solving Methods and XFRACAS [Reliability Edge V7I1]

DMEDI
- Team-based Problem Solving Methods and XFRACAS [Reliability Edge V7I1]

DOE++ Software
- Applying Reliability DOE Techniques to Investigate Effects on Product Life [Reliability Edge V9I1 (2Q 2008)]
- Discussion of the Residual Sum of Squares in DOE [HotWire Issue 86 (April 2008)]
- An Example of Using Reliability DOE for Life Testing [HotWire Issue 88 (June 2008)]
- Introduction to Design of Experiments (DOE) [HotWire Issue 84 (February 2008)]
- Introduction to Design of Experiments (DOE) - DOE Types [HotWire Issue 85 (March 2008)]
- Residual Plots for Lifetime Distributions [HotWire Issue 87 (May 2008)]
- Using DOE++ to Analyze Unbalanced Designs [HotWire Issue 94 (December 2008)]
Downing Event Criticality
- Reliability Importance Measures of Components in a Complex System - Identifying the 20% in the 80/20 Rule [HotWire Issue 66 (August 2006)]
Duty Cycles
- Using Duty Cycles in System Reliability Analysis [HotWire Issue 74 (April 2007)]

[Top]

Early Failure Detection
- Modeling Periodical Inspection and Early Failure Detection in BlockSim [HotWire Issue 62 (April 2006)]
Economical Life Model for Repairable Systems [HotWire Issue 64 (June 2006)]
Effect of Inspection Intervals, The [HotWire Issue 28 (June 2003)]
Effectiveness Factor
- Developmental Testing with Corrective Actions Implemented During the Test and Delayed Fixes [HotWire Issue 36 (February 2004)]
Enterprise-wide Systems
- Is Enterprise-wide, Web-based Software Right for You? It Depends on the Application! [Reliability Edge V7I1]
Engineering Design by Reliability
- Engineering Design by Reliability [Reliability Edge V7I2]
Environmental Testing
- Sources of Reliability Data: Reliability Testing Basics [HotWire Issue 5 (July 2001)]
Error
- Discussion of the Residual Sum of Squares in DOE [HotWire Issue 86 (April 2008)]
- Type I and Type II Errors and Their Applications [HotWire Issue 88 (June 2008)]
Estimating Availability Through Simulation [HotWire Issue 8 (October 2001)]
Estimating Reliability Based on Multiple Random Stress Types [HotWire Issue 82 (December 2007)]
Estimating the Expected Number of Failures for Items with Minimal or Perfect Repair [HotWire Issue 90 (August 2008)]
Event Logs
- Don’t Let Your Event/Maintenance Log Data Go to Waste [HotWire Issue 68 (October 2006)]
Event Space Method
- Determining Reliability for Complex Systems Part 1 [HotWire Issue 2 (April 2001)]
Event Trees
- Modeling Event Trees in RENO [HotWire Issue 63 (May 2006)]
Events
- Fault Tree Analysis, Reliability Block Diagrams and BlockSim FTI Edition [Reliability Edge V4I1]
Examining Risk Priority Numbers in FMEA [Reliability Edge V4I1]
An Example of Using Reliability DOE for Life Testing [HotWire Issue 88 (June 2008)]
Expanded Algebraic Solutions for RBDs and FTDs [HotWire Issue 33 (November 2003)]
Expanded Models for Accelerated Life Test Analysis with Time-Varying Stresses [HotWire Issue 75 (May 2007)]
Exponential Distribution
- Limitations of the Exponential Distribution for Reliability Analysis [Reliability Edge V2I3 (4Q 2001)]
- You Have a Small Data Set: What Do You Do? [HotWire Issue 72 (February 2007)]
Exploring Reliability Analysis Using Simulation [Reliability Edge V2I1 (1Q 2001)]

[Top]

Failure Analysis Data
- Analyzing Accelerated Test Data with Unrelated Failures [HotWire Issue 30 (August 2003)]
- Physics of Failure for Making High Reliability a Reality [Reliability Edge, V4I2]
- Source of Reliability Data: Field Data [HotWire Issue 6 (August 2001)]
Failure Behavior
- Bathtub Curve and Product Failure Behavior Part 1, The [HotWire Issue 21 (November 2002)]
- Bathtub Curve and Product Failure Behavior Part 2, The [HotWire Issue 22 (December 2002)]
Failure Criticality
- Reliability Importance Measures of Components in a Complex System - Identifying the 20% in the 80/20 Rule [HotWire Issue 66 (August 2006)]
Failure Definitions
- Specifications and Product Failure Definitions [HotWire Issue 2 (April 2001)]
- Specifications and Product Failure Definitions [HotWire Issue 35 (January 2004)]
Failure Detection Threshold (FDT)
- On-Condition Maintenance Using P-F Interval or Failure Detection Threshold (FDT) [HotWire Issue 76 (June 2007)]
Failure Modes, Effects and Criticality Analysis [Reliability Edge V3I2 (3Q 2002)]
Fault Avoidance
- Reliability Allocation and Optimization [HotWire Issue 6 (August 2001)]
Fault Tolerance
- Reliability Allocation and Optimization [HotWire Issue 6 (August 2001)]
Fault Tree Analysis, Reliability Block Diagrams and BlockSim FTI Edition [Reliability Edge V4I1]
Fault Trees
- Comparison of RBD and Fault Tree Simulation [HotWire Issue 44 (October 2004)]
- Expanded Algebraic Solutions for RBDs and FTDs [HotWire Issue 33 (November 2003)]
- Fault Tree Analysis, Reliability Block Diagrams and BlockSim FTI Edition [Reliability Edge V4I1]
- Minimal Cut Sets [HotWire Issue 63 (May 2006)]
- Overview of Fault Tree Gates (Part I) [HotWire Issue 37 (March 2004)]
- Overview of Fault Tree Gates (Part II) [HotWire Issue 38 (April 2004)]
- Treating Common Cause Failures in Fault Trees [HotWire Issue 54 (August 2005)]
- Using the Fault Tree Method for Dependent and Independent Failure Modes [HotWire Issue 29 (July 2003)]
Feasibility
- Reliability Allocation and Optimization [HotWire Issue 6 (August 2001)]
Field Data [HotWire Issue 42 (August 2004)]
Field Data
- Bringing It All Together [HotWire Issue 45 (November 2004)]
- Customer Usage Profiling [HotWire Issue 11 (January 2002)]
- Data Collection [HotWire Issue 43 (September 2004)]
- Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]
- Field Data [HotWire Issue 42 (August 2004)]
- Fielded Systems in Reliability Growth (Part I) [HotWire Issue 40 (June 2004)]
- Fielded Systems in Reliability Growth (Part II) [HotWire Issue 41 (July 2004)]
- Source of Reliability Data: Field Data [HotWire Issue 6 (August 2001)]
- Using Reliability Information Throughout the Organization [HotWire Issue 13 (March 2002)]
Fielded Systems in Reliability Growth (Part I) [HotWire Issue 40 (June 2004)]
Fielded Systems in Reliability Growth (Part II) [HotWire Issue 41 (July 2004)]
Financial Applications for Weibull Analysis [HotWire Issue 14 (April 2002)]
Financial Applications for Weibull Analysis [HotWire Issue 35 (January 2004)]
Financial Applications for Weibull Analysis [Reliability Edge V5I1]
Fisher Matrix Confidence Bounds
- Which Analysis Settings Should I Use? [HotWire Issue 1 (March 2001)]
Fleet Analysis
- Analyzing Warranty Data of Repairable Systems [HotWire Issue 64 (June 2006)]
FMEA/FMECA
- Basic Concepts of FMEA and FMECA [HotWire Issue 46 (December 2004)]
- Criticality Analysis [Reliability Edge V4I1]
- Examining Risk Priority Numbers in FMEA [Reliability Edge V4I1]
- Failure Modes, Effects and Criticality Analysis [Reliability Edge V3I2 (3Q 2002)]
- FMEA Success Factors [Reliability Edge V6I1]
- Key Factors for Effective FMEAs [Reliability Edge V6I2]
- Using FMEA Templates to Speed Up and Improve the Quality of FMEA or RCM Analyses [HotWire Issue 77 (July 2007)]
FMEA Accelerator®
- Using FMEA Templates to Speed Up and Improve the Quality of FMEA or RCM Analyses [HotWire Issue 77 (July 2007)]
Foundations of Reliability [HotWire Issue 39 (May 2004)]
FRACAS
Team-based Problem Solving Methods and XFRACAS [Reliability Edge V7I1]
FRED Report
- Case Study Report: Failure Reporting, Evaluation and Display (FRED) Report [Reliability Edge V3I2 (3Q 2002)]
Free Reliability Software [Reliability Edge, V4I2]
Forecasting Data
- Source of Reliability Data: Field Data [HotWire Issue 6 (August 2001)]
Fostering a Culture of Reliability [HotWire Issue 10 (December 2001)]

[Top]

Gates
- Fault Tree Analysis, Reliability Block Diagrams and BlockSim FTI Edition [Reliability Edge V4I1]
- Overview of Fault Tree Gates (Part I) [HotWire Issue 37 (March 2004)]
- Overview of Fault Tree Gates (Part II) [HotWire Issue 38 (April 2004)]
Gamma
- Location Parameter of the Weibull Distribution [HotWire Issue 15 (May 2002)]
Gamma Distribution
- Overview of the Gumbel, Logistic, Loglogistic and Gamma Distributions [HotWire Issue 56 (October 2005)]
General Log-Linear Model for Accelerated Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
Gap Analysis
- Reliability Growth Analysis with Missing or Erroneous Data [HotWire Issue 78 (August 2007)]
General Log Linear Model (GLL)
- Using ALTA with Multi-Stress Physics of Failure Models [HotWire Issue 90 (August 2008)]
General Renewal Process Model (GRP)
- Parametric Recurrence Data Analysis and the GRP Model [HotWire Issue 59 (January 2006)]
Generalized Gamma
- The Generalized Gamma Distribution and Reliability Analysis [HotWire Issue 15 (May 2002)]
Generalized Renewal Process
- On the NHPP with Underlying Distributions of the Location–Scale Family [Reliability Edge V9I1 (2Q 2008)]
Gompertz Models
- Software Reliability Growth Modeling Using the Standard and Modified Gompertz Models [HotWire Issue 84 (February 2008)]
Goodness of Fit
- How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]
- Verifying the Assumption of a Constant Shape Parameter in Accelerated Life Testing Data [HotWire Issue 16 (June 2002)]
Graphical Analysis of Repair Data [Reliability Edge V3I3 (4Q 2002)]
Graphical Comparison of Sets of Repair Data [Reliability Edge, V4I2]
GRP Model (see General Renewal Process Model)
Gumbel Distribution
- Overview of the Gumbel, Logistic, Loglogistic and Gamma Distributions [HotWire Issue 56 (October 2005)]

[Top]

Highlights of the International Applied Reliability Symposium [Reliability Edge, V5I1]
Histograms
- Defining Distributions-Part 1: The Probability Distribution Function [HotWire Issue 12 (Febraury 2002)]
High Value of Beta is Not Necessarily Cause For Concern, A [Reliability Edge V2I1 (1Q 2001)]
How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]
How Long Should You Burn In a System? [HotWire Issue 69 (Novmeber 2006)]
How to Define a Complicated Stress Profile [HotWire Issue 87 (May 2008)]
How to Simplify Complex RBDs with a Commonly Used Distribution [HotWire Issue 68 (October 2006)]
How to Specify for Reliability [Reliability Edge V3I2 (3Q 2002)]
Hypothesis Tests
- Type I and Type II Errors and Their Applications [HotWire Issue 88 (June 2008)]

[Top]

Imperfect Repair
- Imperfect Repair [HotWire Issue 24 (February 2003)]
- Restoration Factors in BlockSim [HotWire Issue 77 (July 2007)]
Implementing an Automated Reliability/Quality System: What You Can Expect [Reliability Edge V3I1 (1Q 2002)]
Importance Measures
- Using Reliability Importance Measures to Guide Component Improvement Efforts [Reliability Edge V1I1 (2Q 2000)]
Indicator Variables
- Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]
- Field Data [HotWire Issue 42 (August 2004)]
Infant Mortality
- Bathtub Curve and Product Failure Behavior Part 1, The [HotWire Issue 21 (November 2002)]
In-House Testing
- Data Collection [HotWire Issue 43 (September 2004)]
- Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]
- Field Data [HotWire Issue 42 (August 2004)]
- Reliability Testing [HotWire Issue 41 (July 2004)]
- Using Reliability Information Throughout the Organization [HotWire Issue 13 (March 2002)]
Inspection
- Maintenance Policies in BlockSim [Hotwire Issue 89 (July 2008)]
- Modeling a Complex Maintenance Scenario in BlockSim [HotWire Issue 89 (July 2008)]
- On-Condition Maintenance Using P-F Interval or Failure Detection Threshold (FDT) [HotWire Issue 76 (June 2007)]
Inspection Intervals
- Analyzing the Effect of Inspection Intervals on Availability [Reliability Edge, V4I2]
- Effect of Inspection Intervals, The [HotWire Issue 28 (June 2003)]
Inspection Rejection Probability
- Modeling a Complex Maintenance Scenario in BlockSim [HotWire Issue 89 (July 2008)]
Intangible Asset Valuation
- Financial Applications for Weibull Analysis [HotWire Issue 14 (April 2002)]
- Financial Applications for Weibull Analysis [HotWire Issue 35 (January 2004)]
- Financial Applications for Weibull Analysis [Reliability Edge V5I1]
Interaction Between the House of Quality (within Design for Six Sigma) and the FMEA (within Design for Reliability) [HotWire Issue 93 (November 2008)]
International Applied Reliability Symposium
- Highlights of the International Applied Reliability Symposium [Reliability Edge, V5I1]
- International Applied Reliability Symposium [Reliability Edge, V4I2]
International Applied Reliability Symposium [Reliability Edge, V4I2]
Interval Censored Data
- An Example of Using Reliability DOE for Life Testing [HotWire Issue 88 (June 2008)]
- Life Data Classifications [Reliability Edge V1I1 (2Q 2000)]
Introducing ReliaSoft's ALTA 6 and ALTA 6 PRO [Reliability Edge V2I2 (2Q 2001)]
Introducing ReliaSoft's Weibull++ 6 [Reliability Edge V2I1 (1Q 2001)]
Introduction to Accelerated Testing Types [Reliability Edge V2I3 (4Q 2001)]
Introduction to Case Study Report: Integrating Weibull Analysis into Bodyshop Reliability Engineering [Reliability Edge V3I2 (3Q 2002)]
Introduction to the Crow-AMSAA Reliability Growth Model [HotWire Issue 49 (March 2005)]
Introduction to Design of Experiments (DOE) [HotWire Issue 84 (February 2008)]
Introduction to Design of Experiments (DOE) - DOE Types [HotWire Issue 85 (March 2008)]
Introduction to Developmental Test Analysis with the Lloyd-Lipow Model [HotWire Issue 52 (June 2005)]
Introduction to the Generalized Eyring Life-Stress Relationship [HotWire Issue 74 (April 2007)]
Introduction to Non-Parametric Recurrence Data Analysis [HotWire Issue 57 (November 2005)]
Introduction to Probability Theory [HotWire Issue 25 (March 2003)]
Introduction to Reliability Growth [HotWire Issue 39 (May 2004)]
Introduction to the Temperature-Humidity Model [HotWire Issue 50 (April 2005)]
Introduction to the Weibull-Bayesian Distribution [HotWire Issue 55 (September 2005)]
ReliaSoft's Ranking Method [HotWire Issue 2 6 (April 2003)]

[Top]

Just-In-Time Philosopy
- Using BlockSim 6 for Planning Just-In-Time Ordering of Spare Parts [HotWire Issue 70 (December 2006)]

[Top]

K-out-of-N Redundancy
- Updating the Classic Reliability Block Diagram Methodology and Constructs [Reliability Edge V3I2 (3Q 2002)]
- Using Reliability Block Diagrams to Analyze Dependent and Independent Failure Modes [HotWire Issue 27 (May 2003)]
Kaplan-Meier Estimator
- Nonparametric Analysis [HotWire Issue 11 (January 2002)]
- Which Analysis Settings Should I Use? [HotWire Issue 1 (March 2001)]
Key Factors for Effective FMEAs [Reliability Edge V6I2]
Kolmogorov-Smirnov (KS) Test
- The Distribution Wizard in Weibull++ 7 [HotWire Issue 91 (September 2008)]
- How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]

[Top]

Lab Reliability
- Bringing It All Together [HotWire Issue 45 (November 2004)]
- Determining the Connection Between Test and Field Reliability [HotWire Issue 54 (August 2005)]
- Field Data [HotWire Issue 42 (August 2004)]
- Using Reliability Information Throughout the Organization [HotWire Issue 13 (March 2002)]
Lambda Predict Software
- Derating for Electronic Components [HotWire Issue 92 (October 2008)]
- Reliability Prediction Methods for Electronic Products [Reliability Edge V9I1 (2Q 2008)]
- Standards Based Reliability Prediction: Applicability and Usage to Augment RBDs - Part I: Introduction to Standards Based Reliability Prediction and Lambda Predict [HotWire Issue 50 (April 2005)]
- Standards Based Reliability Prediction: Applicability and Usage to Augment RBDs - Part II: The Standards for Reliability Prediction [HotWire Issue 51 (May 2005)]
- Standards Based Reliability Prediction: Applicability and Usage to Augment RBDs - Part III: Completing the Picture: Using Lambda Predict to Augment your BlockSim RBDs [HotWire Issue 52 (June 2005)]
- Standards Based Reliability Prediction in a Nutshell [HotWire Issue 70 (December 2006)]
Least Squares Method
- Rank Regression Parameter Estimation [HotWire Issue 10 (December 2001)]
Let the Data Speak About Activation Energy [HotWire Issue 17 (July 2002)]
Life Cycle Cost Analysis [HotWire Issue 47 (January 2005)]
Life Data Analysis of Load Sharing Units [HotWire Issue 81 (November 2007)]
Life Data Analysis with Zero-Time (Out-Of-The-Box) Failures [HotWire Issue 83 (January 2008)]
Life-Stress Models
- General Log-Linear Model for Accelerated Life Data Analysis [Reliability Edge V2I2 (2Q 2001)]
- Introduction to the Generalized Eyring Life-Stress Relationship [HotWire Issue 74 (April 2007)]
- Introduction to the Temperature-Humidity Model [HotWire Issue 50 (April 2005)]
- Look Under the Hood at the Cumulative Damage Model, A [HotWire Issue 23 (January 2003)]
Likelihood Function
- Can the Likelihood Value be Greater Than 0? [HotWire Issue 92 (October 2008)]
- Maximum Likelihood Estimation [HotWire Issue 9 (November 2001)]
- Maximum Likelihood Function [HotWire Issue 33 (November 2003)]
Likelihood Ratio Confidence Bounds [HotWire Issue 42 (August 2004)]
Likelihood Ratio Method
- Common Shape Parameter Likelihood Ratio Test [HotWire Issue 45 (November 2004)]
- Contour Plots and Confidence Bounds on Parameters [HotWire Issue 18 (August 2002)]
- Contour Plots and Confidence Bounds on Parameters (Part II) [HotWire Issue 19 (September 2002)]
- Likelihood Ratio Confidence Bounds [HotWire Issue 42 (August 2004)]
Likelihood Value
- Can the Likelihood Value be Greater Than 0? [HotWire Issue 92 (October 2008)]
- The Distribution Wizard in Weibull++ 7 [HotWire Issue 91 (September 2008)]
- How Good Is Your Assumed Distribution's Fit? [HotWire Issue 71 (January 2007)]
Life Data Classifications [Reliability Edge V1I1 (2Q 2000)]
Limitations of the Exponential Distribution for Reliability Analysis [Reliability Edge V2I3 (4Q 2001)]
Limitations of Using the MTTF as a Reliability Specification, The [HotWire Issue 32 (October 2003)]
Limitations of Using the MTTF as a Reliability Specification, The [Reliability Edge V1I1 (2Q 2000)]
Lloyd-Lipow Model
- Analyzing Growth Success/Failure and Reliability Data Using the Lloyd Lipow Model [HotWire Issue 83 (January 2008)]
- Introduction to Developmental Test Analysis with the Lloyd-Lipow Model [HotWire Issue 52 (June 2005)]
Load Sharing
- Determining the Reliability of a System with Load Sharing [HotWire Issue 20 (October 2002)]
- Life Data Analysis of Load Sharing Units [HotWire Issue 81 (November 2007)]
- Updating the Classic Reliability Block Diagram Methodology and Constructs [Reliability Edge V3I2 (3Q 2002)]
- Using QALT Models to Analyze System Configurations with Load Sharing [Reliability Edge V3I3 (4Q 2002)]
- Using Reliability Block Diagrams to Analyze Dependent and Independent Failure Modes [HotWire Issue 27 (May 2003)]
Load-Strength Interference
- Derating for Electronic Components [HotWire Issue 92 (October 2008)]
Loading Roughness
- Derating for Electronic Components [HotWire Issue 92 (October 2008)]
Location Parameter
- Location Parameter of the Weibull Distribution [HotWire Issue 15 (May 2002)]
Logistic Distribution
- Overview of the Gumbel, Logistic, Loglogistic and Gamma Distributions [HotWire Issue 56 (October 2005)]
Logistic Model
- Analyzing Success/Failure and Reliability Data Using the Logistic Model [HotWire Issue 82 (December 2007)]
Loglogistic Distribution
- Overview of the Gumbel, Logistic, Loglogistic and Gamma Distributions [HotWire Issue 56 (October 2005)]
Lognormal Distribution
- Characteristics of the Lognormal Distribution [HotWire Issue 47 (January 2005)]
Look Under the Hood at the Cumulative Damage Model, A [HotWire Issue 23 (January 2003)]
Looking at Thermal Cycling Data in Quantitative Accelerated Life Testing [HotWire Issue 19 (September 2002)]

[Top]

Maintainability
- Availability and the Different Ways to Calculate It [HotWire Issue 79 (September 2007)
- Estimating Availability Through Simulation [HotWire Issue 8 (October 2001)]
- International Applied Reliability Symposium [Reliability Edge, V4I2]
- Optimum Preventive Maintenance Replacement Time for a Single Component [Reliability Edge V1I1 (2Q 2000)]
- Relationship Between Availability and Reliability [HotWire Issue 2 6 (April 2003)]
- Reliability and Maintainability Analysis for a Remote Telecommunications System [Reliability Edge V4I1]
Maintenance Crews
- Using Pools and Crews in System Analysis (Part I) [HotWire Issue 29 (July 2003)]
- Using Pools and Crews in System Analysis (Part II) [HotWire Issue 30 (August 2003)]
Maintenance Logs
- Don’t Let Your Event/Maintenance Log Data Go to Waste [HotWire Issue 68 (October 2006)]
Maintenance Plans
- Analysis and Modeling of Grouped and Opportunistic Preventive Maintenance [HotWire Issue 78 (August 2007)]
- Analyzing the Effect of Inspection Intervals on Availability [Reliability Edge, V4I2]
- Creating Initial Scheduled Maintenance Plans: Using the MSG-3 Aircraft Systems and Powerplant Analysis Process to Develop an Initial Scheduled Maintenance Plan [Reliability Edge V3I1 (1Q 2002)]
- Comparing Maintenance Strategies Based on Cost and Availability [Reliability Edge V6I2]
- On-Condition Maintenance Using P-F Interval or Failure Detection Threshold (FDT) [HotWire Issue 76 (June 2007)]
- The RCM Perspective on Maintenance [HotWire Issue 71 (January 2007)]
Maintenance Policies
- Maintenance Policies in BlockSim [Hotwire Issue 89 (July 2008)]
- Using Maintenance Policies [HotWire Issue 31 (September 2003)]
Maximum Likelihood Estimation
- Can the Likelihood Value be Greater Than 0? [HotWire Issue 92 (October 2008)]
- Comparison of MLE and Rank Regression When the Data Set Contains Suspensions [HotWire Issue 16 (June 2002)]
- Maximum Likelihood Estimation [HotWire Issue 9 (November 2001)]
- Maximum Likelihood Function [HotWire Issue 33 (November 2003)]
- Likelihood Ration Confidence Bounds [HotWire Issue 42 (August 2004)]
- Which Analysis Settings Should I Use? [HotWire Issue 1 (March 2001)]
- Understanding Biasedness [HotWire Issue 25 (March 2003)]
Maximum Likelihood Function [HotWire Issue 33 (November 2003)]
Mean Cumulative Function
- Graphical Analysis of Repair Data [Reliability Edge V3I3 (4Q 2002)]
- Graphical Comparison of Sets of Repair Data [Reliability Edge, V4I2]
Mean Life Function
- Characteristics of the Weibull Distribution [HotWire Issue 14 (April 2002)]
- Limitations of Using the MTTF as a Reliability Specification, The [HotWire Issue 32 (October 2003)]
- Limitations of Using the MTTF as a Reliability Specification, The [Reliability Edge V1I1 (2Q 2000)]
Mean Time Between Replacements
- MTTF, MTBF, Mean Time Between Replacements and MTBF with Scheduled Replacements [HotWire Issue 94 (December 2008)]
Minimal Cut Sets [HotWire Issue 63 (May 2006)]
Mixed Weibull Analysis
- Beta Binomial Confidence Bounds on the Mixed Weibull Distribution [HotWire Issue 48 (February 2005)]
- Multimodal Analysis [HotWire Issue 12 (February 2002)]
A Model to Estimate Restoration Factors [Reliability Edge V6I1]
Modeling a Complex Maintenance Scenario in BlockSim [HotWire Issue 89 (July 2008)]
Modeling Event Trees in RENO [HotWire Issue 63 (May 2006)]
Modeling Interactions Between Variables in Accelerated Life Testing or Life-Stress Analysis [HotWire Issue 53 (July 2005)]
Modeling Periodical Inspection and Early Failure Detection in BlockSim [HotWire Issue 62 (April 2006)]
Monitoring Warranty Returns Using Statistical Process Control (SPC) [HotWire Issue 58 (December 2005)]
Monte Carlo Simulation
- Determining Reliability for Complex Systems Part 2 [HotWire Issue 3 (May 2001)]
- Estimating Availability Through Simulation [HotWire Issue 8 (October 2001)]
- Solving Complex Probabilistic Problems Through Simulation [Reliability Edge V6I2]
- Using Weibull++ 7 and Monte Carlo Simulation for Probabilistic Design [HotWire Issue 56 (October 2005)]
More Case Study Examples [Reliability Edge, V4I2]
MPC Software
- Creating Initial Scheduled Maintenance Plans: Using the MSG-3 Aircraft Systems and Powerplant Analysis Process to Develop an Initial Scheduled Maintenance Plan [Reliability Edge V3I1 (1Q 2002)]
MSG-3
- Creating Initial Scheduled Maintenance Plans: Using the MSG-3 Aircraft Systems and Powerplant Analysis Process to Develop an Initial Scheduled Maintenance Plan [Reliability Edge V3I1 (1Q 2002)]
MTBF/MTTF
- Avoiding a Common Mistake in the Analysis of Repairable Systems[Reliability Edge V7I1]
- Bathtub Curve and Product Failure Behavior Part 2, The [HotWire Issue 22 (December 2002)]
- Characterizing Your Product's Reliability [HotWire Issue 1 (March 2001)]
- Characterizing Your Product's Reliability [HotWire Issue 32 (October 2003)]
- Developmental Testing with Corrective Actions Implemented During the Test and Delayed Fixes [HotWire Issue 36 (February 2004)]
- Limitations of the Exponential Distribution for Reliability Analysis [Reliability Edge V2I3 (4Q 2001)]
- Limitations of Using the MTTF as a Reliability Specification, The [HotWire Issue 32 (October 2003)]
- Limitations of Using the MTTF as a Reliability Specification, The [Reliability Edge V1I1 (2Q 2000)]
- MTTF, MTBF, Mean Time Between Replacements and MTBF with Scheduled Replacements [HotWire Issue 94 (December 2008)]
- Reliability Growth Test Planning and Management [Reliability Edge V3I3 (4Q 2002)], [HotWire Issue 65 (July 2006)]
- Specifications and Product Failure Definitions [HotWire Issue 2 (April 2001)]
- Specifications and Product Failure Definitions [HotWire Issue 35 (January 2004)]
MTTF, MTBF, Mean Time Between Replacements and MTBF with Scheduled Replacements [HotWire Issue 94 (December 2008)]
Multimodal Analysis [HotWire Issue 12 (February 2002)]